The analysis technique mostly used the AGLAE the accelerator is based on the detection of X-rays. The PIXE (Particle Induced X-ray Emission) technique uses X-ray emission induced by accelerated charged particles that interact with the atoms of the materials encountered in the same way as radiation emitted by radioactive processes. When the particle pull out one of his innermost electrons of an atom, the atom reacts by emitting an X-ray of characteristic energy.
These X-rays are able to get out of the material analyzed. They are produced in large numbers, they can be detected and their energy measured. From the energy spectrum of these X-rays photons, the fundamental composition of the sample can be deduced.
The method is similar in principle to X-ray fluorescence used in industry. But while the radiation used in X-ray fluorescence (gamma or X rays) penetrates deeply into the material, it is the surface of the sample that is analyzed with PIXE, since the ions from the accelerator stop after few microns.
Finally, this technique is local: the beam of projectiles, the diameter of which can be chosen between a few millimetres and one micron, can study such details as a weld in a piece of jewellery or an inlay.
The accelerated particles penetrate little in the target and only probe the surface. Thus, two million electron volts protons allow analyzing a piece of silver of 10 microns thickness. For potteries, the path of protons does not exceed a few tens of micron.
This technique has indeed an essential feature in this field of investigation : It is non destructive. A breakthrough has been to develop an experimental device allowing direct analysis without necessitating a sample of the object. This is achieved by extracting the beam in air through an exit window ultra-thin, down to 0.1 microns thick.
Two other analysis techniques (*) are also used, sometimes in combination with PIXE: the emission of gamma induced by nuclear reactions (PIGE method): The "Rutherford backscattering (RBS) which identifies the nature of nuclei from beam particles which bounce back.
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